SEMI-PointTrend: A félvezetőhiba-elemzés pontosságának és részletességének javítása a SEM-képekben
Semiconductor defect analysis is a critical process for ensuring the quality of semiconductor devices. As such, it is important to have an accurate and detailed analysis of the defects present in the device. SEMI-PointRend is a new technology that is designed to enhance the accuracy and detail of semiconductor defect analysis in SEM images. SEMI-PointRend is a software-based solution that uses machine learning algorithms to analyze SEM images. It can detect and classify defects in the images with high accuracy and detail. The software uses a combination of deep learning,