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eringSemiconductor defect detection is a critical process in the production of integrated circuits. It is important to detect any defects in the manufacturing process to ensure that the final product is of high quality and meets the required standards. The use of scanning electron microscopy (SEM) images to detect defects has become increasingly popular due to its ability to provide detailed images of the surface of the semiconductor. However, traditional SEM image analysis techniques are limited in their ability to accurately detect defects.Recently, a new technique called SEMI-PointRendering has been